A Physically Unclonable Function with 0% BER Using Soft Oxide Breakdown in 40nm CMOS

被引：0

作者：

Chuang, Kai-Hsin ^{[1
,2
]}

Bury, Erik ^{[2
]}

Degraeve, Robin ^{[2
]}

Kaczer, Ben ^{[2
]}

Linten, Dimitri ^{[2
]}

Verbauwhede, Ingrid ^{[1
]}

机构：

[1] Katholieke Univ Leuven, COSIC, IMEC, Leuven, Belgium

[2] IMEC, Leuven, Belgium

来源：

2018 IEEE ASIAN SOLID-STATE CIRCUITS CONFERENCE (A-SSCC): PROCEEDINGS OF TECHNICAL PAPERS | 2018年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A physically unclonable function (PUF) utilizing the randomness of soft oxide breakdown (BD) locations in MOSFETs is presented. The so-called soft-BD PUF features a self-limiting mechanism to generate one single soft-BD spot in a pair of MOSFETs; the subsequent BD location is used as the source of entropy to generate a highly stable "0" or "1" bit with an equal probability of 0.5. The soft-BD PUF comprising all the essential periphery circuits are fabricated in a 40nm CMOS process. Experiments show that the PUF has no instability in most of the operating conditions using the proposed readout scheme. The native bit error rate remains zero from V-DD=0.8V to 1.5V at room temperature and from -20 degrees C to 120 degrees C at nominal V-DD=0.9V. The throughput is shown to be at least 40 Mb/s and the PUF readout consumes only 51.8 fJ/bit. The randomness and uniqueness of the PUF are close to an ideal case, and no spatial correlation was observed.

引用

页码：157 / 160

页数：4

共 12 条

[1] [Anonymous], BENEFITS ANTIFUSE OT
[2] Bhargava M, 2013, LECT NOTES COMPUT SC, V8086, P90, DOI 10.1007/978-3-642-40349-1_6
[3] Chuang KH, 2017, INT RELIAB PHY SYM
[4] Helper Data Algorithms for PUF-Based Key Generation: Overview and Analysis
Delvaux, Jeroen
Gu, Dawu
Schellekens, Dries
Verbauwhede, Ingrid
[J]. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2015, 34 (06) : 889 - 902
[5] Killmann W., 2011, PROPOSAL FUNCTIONALI
[6] Liu M., 2017 IEEEACM INT S L, P1
[7] OxID: On-Chip One-Time Random ID Generation using Oxide Breakdown
Liu, Nurrachman
Hanson, Scott
Sylvester, Dennis
Blaauw, David
[J]. 2010 SYMPOSIUM ON VLSI CIRCUITS, DIGEST OF TECHNICAL PAPERS, 2010, : 231 - 232
[8] Experimental Characterization of Physical Unclonable Function Based on 1 kb Resistive Random Access Memory Arrays
Liu, Rui
Wu, Huaqiang
Pang, Yachuan
Qian, He
Yu, Shimeng
[J]. IEEE ELECTRON DEVICE LETTERS, 2015, 36 (12) : 1380 - 1383
[9] Maes R, 2014, 2014 IEEE INTERNATIONAL SYMPOSIUM ON HARDWARE-ORIENTED SECURITY AND TRUST (HOST), P148, DOI 10.1109/HST.2014.6855586
[10] Pey KL, 2002, INTERNATIONAL ELECTRON DEVICES 2002 MEETING, TECHNICAL DIGEST, P163, DOI 10.1109/IEDM.2002.1175804

← 1 2 →