Ab initio modeling of thermal effects in 2D van der Waals materials

被引：0
|
作者：
Luisier, Mathieu [1 ]
Fiore, Sara [1 ]
Bunjaku, Teute [1 ]
Backman, Jonathan [1 ]
Klinkert, Cedric [1 ]
Szabo, Aron [1 ]
机构：
[1] Swiss Fed Inst Technol, Integrated Syst Lab, CH-8092 Zurich, Switzerland
来源：
2021 CONFERENCE ON LASERS AND ELECTRO-OPTICS EUROPE & EUROPEAN QUANTUM ELECTRONICS CONFERENCE (CLEO/EUROPE-EQEC) | 2021年
关键词：
D O I：
10.1109/CLEO/Europe-EQEC52157.2021.9541657
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页数：1
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