Analytical electron tomography

被引：12

作者：

Leary, Rowan K. ^{[1
]}

Midgley, Paul A. ^{[1
]}

机构：

[1] Univ Cambridge, Dept Materials Sci & Met, Cambridge, England

来源：

MRS BULLETIN | 2016年 / 41卷 / 07期

基金：

欧洲研究理事会; 英国工程与自然科学研究理事会;

关键词：

NANOPARTICLES; TOOL;

D O I：

10.1557/mrs.2016.132

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This article highlights recent advances in analytical electron tomography (AET), the three-dimensional (3D) extension of conventional nanoanalytical techniques, in which electron energy loss, x-ray spectroscopy, and electron diffraction are combined with tomographic acquisition and reconstruction. Examples from the literature illustrate how new 3D information, gleaned from AET, provides insights into not just morphology and composition, but also the electronic, chemical, and optical properties of materials at the nanoscale. We describe how the "multidimensional" nature of AET leads to "big data" sets, how these can be analyzed optimally, and how AET may develop further.

引用

页码：531 / 536

页数：6

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