Three-dimensional total internal reflection microscopy

被引：37

作者：

Carney, PS ^{[1
]}

Schotland, JC ^{[1
]}

机构：

[1] Washington Univ, Dept Elect Engn, St Louis, MO 63130 USA

来源：

OPTICS LETTERS | 2001年 / 26卷 / 14期

关键词：

D O I：

10.1364/OL.26.001072

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We investigate the inverse-scattering problem that arises in total internal reflection microscopy. An analytic solution to this problem within the weak-scattering approximation is used to develop a novel form of three-dimensional microscopy with subwavelength resolution. (C) 2001 Optical Society of America.

引用

页码：1072 / 1074

页数：3

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