In Situ Thermal Decomposition of Exfoliated Two-Dimensional Black Phosphorus

被引:212
作者
Liu, Xiaolong [1 ]
Wood, Joshua D. [2 ]
Chen, Kan-Sheng [2 ]
Cho, EunKyung [2 ]
Hersam, Mark C. [1 ,2 ,3 ,4 ]
机构
[1] Northwestern Univ, Grad Program Appl Phys, Evanston, IL 60208 USA
[2] Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA
[3] Northwestern Univ, Dept Chem, Evanston, IL 60208 USA
[4] Northwestern Univ, Dept Med, Evanston, IL 60208 USA
关键词
PHOTOLUMINESCENCE; SEMICONDUCTOR; SUBLIMATION; TRANSISTORS; TRANSPORT; GRAPHENE; BEHAVIOR; DEFECTS; SURFACE; GROWTH;
D O I
10.1021/acs.jpclett.5b00043
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
With a semiconducting band gap and high charge carrier mobility, two-dimensional (2D) black phosphorus (BP)-often referred to as phosphorene-holds significant promise for next generation electronics and optoelectronics. However, as a 2D material, it possesses a higher surface area to volume ratio than bulk BP, suggesting that its chemical and thermal stability will be modified. Herein, an atomic-scale microscopic and spectroscopic study is performed to characterize the thermal degradation of mechanically exfoliated 2D BP. From in situ scanning/transmission electron microscopy, decomposition of 2D BP is observed to occur at similar to 400 degrees C in vacuum, in contrast to the 550 degrees C bulk BP sublimation temperature. This decomposition initiates via eye-shaped cracks along the [001] direction and then continues until only a thin, amorphous red phosphorus like skeleton remains. In situ electron energy loss spectroscopy, energy-dispersive X-ray spectroscopy, and energy-loss near-edge structure changes provide quantitative insight into this chemical transformation process.
引用
收藏
页码:773 / 778
页数:6
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