Parameter extraction of a base-collector equivalent circuit model for sige heterojunction bipolar transistors

被引:0
作者
Lee, S [1 ]
机构
[1] Hankuk Univ Foreign Studies, Dept Elect Engn, Yongin 449791, South Korea
关键词
SiGeHBT; parameter extraction; modeling; equivalent circuit; S parameters;
D O I
10.1002/mop.11067
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
By deriving new Z-parameter equations, accurate extraction is performed to determine all base-collector model parameters in a SiGe heterojunction bipolar transistor (HBT) equivalent circuit directly from measured S parameters, without any test structure and geometric calculation. The calculated power and current gains are in good agreement with the measured gains, thus verifying the accuracy of the extraction. (C) 2003 Wiley Periodicals, Inc.
引用
收藏
页码:384 / 387
页数:4
相关论文
共 50 条
[21]   On the accuracy of direct extraction of the heterojunction-bipolar-transistor equivalent-circuit model tarameters Cπ, CBC, and RE [J].
Dvorak, MW ;
Bolognesi, CR .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2003, 51 (06) :1640-1649
[22]   Germanium content and base doping level influence on extrinsic base resistance and dynamic performances of SiGe:C heterojunction bipolar transistors [J].
Ramirez-Garcia, E. ;
Zerounian, N. ;
Aniel, F. ;
Valdez-Monroy, L. A. ;
Rodriguez-Mendez, L. M. ;
Valdez-Perez, D. ;
Galaz-Larios, M. C. ;
Enciso-Aguilar, M. A. .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2014, 29 (09)
[23]   Parameter Extraction for Equivalent Circuit Model of RF Devices Based on a Hybrid Optimization Method [J].
Guan, Zhimin ;
Zhao, Peng ;
Lao, Qizhong ;
Wang, Xianbing ;
Wang, Gaofeng .
ELECTRONICS, 2019, 8 (10)
[24]   A new approach to parameter extraction for equivalent circuit model of Terahertz Antenna [J].
Li Yue ;
Wei Zhennan .
2015 IEEE International Conference on Signal Processing, Communications and Computing (ICSPCC), 2015, :920-923
[25]   Extraction of the base and emitter resistances in bipolar transistors using an accurate base resistance model [J].
Ingvarson, F ;
Linder, M ;
Jeppson, KO .
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 2003, 16 (02) :228-232
[26]   Characteristic function approach to analytical parameter extraction, verification, and circuit calibration for small-signal equivalent circuit of field effect transistors [J].
Huang, F. Y. ;
Wei, Z. N. ;
Zhang, Y. M. ;
Tang, X. S. ;
Jiang, N. .
SOLID-STATE ELECTRONICS, 2020, 165
[27]   THERMAL PARAMETER EXTRACTION FOR BIPOLAR CIRCUIT MODELING [J].
FOX, RM ;
LEE, SG .
ELECTRONICS LETTERS, 1991, 27 (19) :1719-1720
[28]   SiGe-heterojunction bipolar transistors: Key technologies and applications in communication systems [J].
Behammer, D ;
Gruhle, A ;
Konig, U ;
Schuppen, A .
INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, 1997, 27 (04) :251-259
[29]   Si/SiGe:C and InP/GaAsSb Heterojunction Bipolar Transistors for THz Applications [J].
Chevalier P. ;
Schroter M. ;
Bolognesi C.R. ;
D'Alessandro V. ;
Alexandrova M. ;
Bock J. ;
Flickiger R. ;
Fregonese S. ;
Heinemann B. ;
Jungemann C. ;
Lovblom R. ;
Maneux C. ;
Ostinelli O. ;
Pawlak A. ;
Rinaldi N. ;
Rucker H. ;
Wedel G. ;
Zimmer T. .
Proceedings of the IEEE, 2017, 105 (06) :1035-1050
[30]   Irradiation effects of 25 MeV silicon ions on SiGe heterojunction bipolar transistors [J].
Sun, YaBin ;
Fu, Jun ;
Xu, Jun ;
Wang, YuDong ;
Zhou, Wei ;
Zhang, Wei ;
Cui, Jie ;
Li, GaoQing ;
Liu, ZhiHong .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2013, 312 :77-83