Environmental trace-element analysis using a benchtop total reflection X-ray, fluorescence spectrometer

被引：65
|
作者：
Stosnach, H [1 ]
机构：
[1] Rontec AG, D-12489 Berlin, Germany
来源：
ANALYTICAL SCIENCES | 2005年 / 21卷 / 07期
关键词：
D O I：
10.2116/analsci.21.873
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
Total reflection X-ray fluorescence (TXRF) analysis is an established technique for trace-element analysis in various types of samples. Though expensive large-scale systems restricted the applications in the past, in this study the capability of a benchtop system for trace elemental analysis is reported. The suitability of this system for the mobile on-site analysis of heavy metal contaminated soils and sediments is reported as well as the possibilities and restrictions of TXRF for additional applications, including trace-element analysis of water, glass and biological samples.
引用
收藏
页码：873 / 876
页数：4
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