Enhancement in IEEE 1500 Standard for at-speed Test and Debug

被引：0

作者：

Ali, Ghazanfar ^{[1
]}

Hussini, Fawnizu Azmadi ^{[1
]}

Ali, Noohul Basheer Zain ^{[1
]}

Hamidi, Nor Hisham ^{[1
]}

Adnan, Raja Mahmud ^{[2
]}

机构：

[1] Univ Teknol PETRONAS, Ctr Intelligent Signal & Imaging Res CISIR, Elect & Elect Engn Dept, Seri Iskandar, Perak, Malaysia

[2] Intel, Bayan Lepas, Penang, Malaysia

来源：

2014 IEEE DALLAS CIRCUITS AND SYSTEMS CONFERENCE (IEEE DCAS 2014) | 2014年

关键词：

IEEE; 1500; Standard; Functional Test; Functional Debug; Software Based Self-Testing (SBST);

D O I：

暂无

中图分类号：

学科分类号：

摘要：

IEEE 1500 standard provides the facility to test and debug embedded cores with the use of an on-board or off-board tester. So far all the developments in IEEE 1500 standard are for testing application in the test mode. No development in IEEE 1500 standard is proposed where IEEE 1500-compliant cores can be tested in functional mode of operation. In this paper, an enhancement of the IEEE 1500 standard for functional test and debug is proposed. As a case study, the proposed enhanced IEEE 1500 standard is implemented and validated on a SAYEH processor using embedded Software Based Self-Testing (SBST) technique. The case study demonstrated that the enhancement in IEEE 1500 standard enables it to be used for at-speed test and debug with increased observability.

引用

页数：4

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