Effect of Y doping on microstructure and thermophysical properties of yttria stabilized hafnia ceramics

被引：33

作者：

Li, Chun ^{[1
]}

Ma, Yue ^{[1
]}

Xue, Zhaolu ^{[1
]}

Yang, Yonghong ^{[2
]}

Chen, Jianhua ^{[2
]}

Guo, Hongbo ^{[1
]}

机构：

[1] Beihang Univ BUAA, Sch Mat Sci & Engn, Beijing Key Lab Adv Funct Mat & Thin Film Technol, 37 Xueyuan Rd, Beijing 100191, Peoples R China

[2] Xian Aerosp Prop Inst, Xian Natl Civil Aerosp Ind Base, 289 Fei Tian Rd, Xian 71000, Shaanxi, Peoples R China

来源：

CERAMICS INTERNATIONAL | 2018年 / 44卷 / 15期

基金：

中国国家自然科学基金;

关键词：

Yttria stabilized hafnia (YSH); Phase stability; Microstructure; Thermophysical properties; THERMAL BARRIER COATINGS; EB-PVD; SOLID-SOLUTIONS; CONDUCTIVITY; ZIRCONIA; EXPANSION; BEHAVIOR;

D O I：

10.1016/j.ceramint.2018.07.030

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A series of Y2O3-doped HfO2 ceramics (Hf1-xYxO2-0.5x, x = 0, 0.04, 0.08, 0.12, 0.16 and 0.2) were synthesized by solid-state reaction at 1600 degrees C. The microstructure, thermophysical properties and phase stability were investigated. Hf1-xYxO2-0.5x ceramics were comprised of monoclinic (M) phase and cubic (C) phase when Y3+ ion concentration ranged from 0.04 to 0.16. The thermal conductivity of Hf1-xYxO2-0.5x ceramic decreased as Y3+ ion concentration increased and Hf0.8Y0.2O1.9 ceramic revealed the lowest thermal conductivity of similar to 1.8 W/m*K at 1200 degrees C. The average thermal expansion coefficient (TEC) of Hf1-xYxO2-0.5x between 200 degrees C and 1300 degrees C increased with the Y3+ ion concentration. Hf0.8Y0.2O1.9 yielded the highest TEC of similar to 10.4 x 10(-6) K-1 while keeping good phase stability between room temperature and 1600 degrees C.

引用

页码：18213 / 18221

页数：9

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