Time evolution of GaAs(111) surface morphology and desorption rate during Langmuir evaporation: Monte Carlo simulation

被引:0
作者
Spirina, A. A. [1 ]
Shwartz, N. L. [1 ,2 ]
机构
[1] Rzhanov Inst Semicond Phys, Novosibirsk 630090, Russia
[2] Novosibirsk State Tech Univ, Novosibirsk 630073, Russia
基金
俄罗斯基础研究基金会;
关键词
GaAs; Surface; Annealing; Kinetics; Monte Carlo simulation; DROPLETS; GALLIUM; VAPORIZATION;
D O I
10.1016/j.mssp.2021.106025
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The high-temperature GaAs annealing kinetics is studied by Monte Carlo simulation. The evaporation rate dependences on the annealing time are obtained for (111)A and (111)B substrate surfaces in a 800-1200 K temperature range. The surface morphology evolution and evaporation kinetics are shown to be dependent on the GaAs substrate orientation. The congruent evaporation of (111)A surface corresponds to the layer-by-layer evaporation mode, while, on the (111)B surface, multilayer vacancy islands are formed. At temperatures exceeding the congruent evaporation temperature, the initial evaporation stage before the gallium droplet formation agrees with the congruent evaporation mode. The appearance of Ga droplets on the surface, corresponding to the start of incongruent evaporation regime, results in a sharp fall of the GaAs evaporation rate. It is found that the Ga droplet on vicinal surfaces locally inverts the step movement direction.
引用
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页数:8
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