Demonstration of high performance visible-blind 4H-SiC avalanche photodiodes

被引:1
作者
Yan, F
Luo, YB
Zhao, JH
Dries, C
Olsen, G
机构
[1] Rutgers State Univ, Dept Elect & Comp Engn, SiCLAB, Piscataway, NJ 08854 USA
[2] Sensors Unlimited Inc, Princeton, NJ 08540 USA
来源
SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2 | 2000年 / 338-3卷
关键词
avalanche photodiodes; photoresponsivity; response speed; UV detectors; visible-blind;
D O I
10.4028/www.scientific.net/MSF.338-342.1383
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
4H-SiC visible-blind reach-through avalanche photodiodes (RAPDs) are designed and fabricated with mesa edge termination and thermal oxide passivation techniques. The devices show a "hard" avalanche breakdown with a positive temperature coefficient, a wide spectral range (285nm to 360nm) with higher than 100A/W photoresponsivity, and a peak photoresponsivity of 738A/W at 320nm. The visible-blind rejection ratio, defined as the maximum responsivity divided by the responsivity at 400nm, has a maximum value of about 2500 at 93.9V reverse bias. The APD photoresponse speed is studied and a fall time of 4.0ns is measured.
引用
收藏
页码:1383 / 1386
页数:4
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