Focusing and photon-flux measurements of the 2.88 nm radiation at the sample plane of the Soft X-ray microscope, based on capillary discharge source

被引:4
作者
Nawaz, M. Fahad [1 ,2 ]
Jancarek, Alexandr [1 ]
Nevrkla, Michal [1 ]
Wachulak, Przemyslaw [2 ]
Limpouch, Jiri [1 ]
Pina, Ladislav [1 ]
机构
[1] Czech Tech Univ, Fac Nucl Sci & Phys Engn, Dept Phys Elect, CR-11519 Prague 1, Czech Republic
[2] Mil Univ Technol, Inst Optoelect, PL-00908 Warsaw, Poland
来源
EUV AND X-RAY OPTICS: SYNERGY BETWEEN LABORATORY AND SPACE IV | 2015年 / 9510卷
关键词
Soft X-rays (SXR); SXR microscopy; capillary discharge; XUV; water-window; Fresnel zone plate;
D O I
10.1117/12.2197154
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Feasibility measurements leading to the development of a Soft X-ray (SXR) microscopy setup, based on capillary discharge XUV source is presented. Here the Z-pinching plasma is acting as a source of XUV radiation, emitting incoherent radiation in the "water-window" (lambda = 2.3 - 4.4 nm) region of interest (natural contrast between the carbon and oxygen edges). This soft X-ray microscopy setup will realize imaging of the biological objects with high spatial resolution. The 2.88 nm radiation line is filtered out from the water-window band, and is focused by an axi-symmetric ellipsoidal mirror, coated with nickle. The focussed spot size is measured and reported. Flux measurements for the available number of photons (photons/pulse) at the sample plane has been carried out with AXUV PIN diode at the sample plane (slightly out of focus). For imaging, a fresnel zone plate lens will be used as an objective. The overall compact transmission SXR microscopy setup design is presented.
引用
收藏
页数:7
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