Epitaxial growth of hexagonal CdS films on hydrogen-terminated Si(111) substrates

被引:8
作者
Seto, S [1 ]
Nosho, Y [1 ]
Kousho, T [1 ]
Kitani, H [1 ]
Yamada, S [1 ]
机构
[1] Ishikawa Natl Coll Technol, Dept Elect Engn, Kahoku, Ishikawa 9290392, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 2003年 / 42卷 / 10A期
关键词
CdS; Si(111); epitaxy; X-ray diffraction; photoluminescence; exciton;
D O I
10.1143/JJAP.42.L1123
中图分类号
O59 [应用物理学];
学科分类号
摘要
Hexagonal US films were epitaxially grown directly on hydrogen-terminated Si(111) substrates with nominally 0degrees (just-orientated) and 3degrees-off-orientated surfaces by the hot-wall epitaxy technique. X-ray diffraction theta-2theta scans and pole figures confirmed the epitaxial relationship between the grown US film and Si substrate to be CdS(0001) parallel to Si(111) and CdS[11 (2) over bar0] parallel toSi[1 (1) over bar0]. Strong excitonic emissions as well as donor-acceptor pair emissions were observed for the US film grown on the 3degreesoff-orientated Si(111) substrate. In the US film on the just-orientated Si(111) substrate, on the other hand, no excitonic emissions could be observed.
引用
收藏
页码:L1123 / L1125
页数:3
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