Temperature dependence of electronic parameters of organic Schottky diode based on fluorescein sodium salt

被引:38
作者
Yahia, I. S. [1 ]
Farag, A. A. M. [1 ]
Yakuphanoglu, F. [2 ]
Farooq, W. A. [3 ]
机构
[1] Ain Shams Univ, Fac Educ, Dept Phys, Cairo, Egypt
[2] Firat Univ, Dept Met & Mat Engn, TR-23169 Elazig, Turkey
[3] King Saud Univ, Coll Sci, Dept Phys & Astron, Riyadh 11451, Saudi Arabia
关键词
Organic semiconductor; Al/FSS Schottky diode; Rectification; Current-voltage; Capacitance-voltage; CURRENT-VOLTAGE CHARACTERISTICS; PHOTOVOLTAIC CHARACTERISTICS; ELECTRICAL CHARACTERISTICS; SILICON HETEROJUNCTIONS; IMPEDANCE SPECTROSCOPY; CONDUCTION MECHANISM; TRANSPORT MECHANISMS; BULK HETEROJUNCTIONS; CAPACITANCE; JUNCTIONS;
D O I
10.1016/j.synthmet.2011.02.016
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The electrical properties of an organic Schottky diode based on fluorescein sodium salt were investigated by current density-voltage and capacitance-voltage measurements. The crystal structure of fluorescein sodium salt, FSS in powder form was analyzed by X-ray diffraction method. X-ray diffraction results showed that the fluorescein sodium salt has a polycrystalline structure with a monoclinic system. The current density-voltage and capacitance-voltage characteristics of Al/FSS Schottky diode were investigated in the temperature range of 300-400 K. The diode exhibits a rectifying behavior, indicating the formation of the Schottky type junction at the interface of Al/FSS. The predominant charge transport mechanism of the Al/FSS Schottky diode was discussed and the proposed current injection processes was presented. The temperature dependence of the calculated acceptor concentration, the built-in potential and the width of the depletion region of Al/FSS Schottky barrier was also determined. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:881 / 887
页数:7
相关论文
共 41 条
[1]   The role of the interface insulator layer and interface states on the current-transport mechanism of Schottky diodes in wide temperature range [J].
Altindal, S ;
Dökme, I ;
Bülbül, MM ;
Yalçin, N ;
Serin, T .
MICROELECTRONIC ENGINEERING, 2006, 83 (03) :499-505
[2]  
[Anonymous], 2001, ELEMENTS XRAY DIFFRA
[3]   Molecular control over Ag/p-Si diode by organic layer [J].
Aydin, M. E. ;
Yakuphanoglu, F. .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 2007, 68 (09) :1770-1773
[4]   Electrical characterization of Al/MEH-PPV/p-Si Schottky diode by current-voltage and capacitance-voltage methods [J].
Aydin, Mehmet Enver ;
Yakuphanoglu, Fahrettin ;
Eom, Jae-Hoon ;
Hwang, Do-Hoon .
PHYSICA B-CONDENSED MATTER, 2007, 387 (1-2) :239-244
[5]   Characterization of capacitance-frequency features of Sn/polypyrrole/n-Si structure as a function of temperature [J].
Aydogan, S ;
Saglam, M ;
Türüt, A .
POLYMER, 2005, 46 (16) :6148-6153
[6]   Charge transport and microstructure in PFO:MEH-PPV polymer blend thin films [J].
Bajpai, Manisha ;
Srivastava, Ritu ;
Kamalasanan, M. N. ;
Tiwari, R. S. ;
Chand, Suresh .
SYNTHETIC METALS, 2010, 160 (15-16) :1740-1744
[7]   Band unpinning and photovoltaic model for P3HT:PCBM organic bulk heterojunctions under illumination [J].
Bisquert, Juan ;
Garcia-Belmonte, Germa ;
Munar, Antoni ;
Sessolo, Michele ;
Soriano, Alejandra ;
Bolink, Henk J. .
CHEMICAL PHYSICS LETTERS, 2008, 465 (1-3) :57-62
[8]   STUDIES OF TUNNEL MOS DIODES .1. INTERFACE EFFECTS IN SILICON SCHOTTKY DIODES [J].
CARD, HC ;
RHODERICK, EH .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1971, 4 (10) :1589-+
[9]   Frequency dependent electrical transport properties of 4,4′,4"-tris(N-3-methylphenyl-N-phenylamine)triphenylamine by impedance spectroscopy [J].
Chauhan, Gayatri ;
Srivastava, Ritu ;
Tyagi, Priyanka ;
Kumar, Amit ;
Srivastava, P. C. ;
Kamalasanan, M. N. .
SYNTHETIC METALS, 2010, 160 (13-14) :1422-1426
[10]   TEMPERATURE-DEPENDENCE OF IV AND C-V CHARACTERISTICS OF NI/N-CDF2 SCHOTTKY-BARRIER TYPE DIODES [J].
COVA, P ;
SINGH, A .
SOLID-STATE ELECTRONICS, 1990, 33 (01) :11-19