Dielectric and Grain-Boundary Characteristics of Hot Pressed CaCu3Ti4O12

被引：11

作者：

Kim, Byeong Kon ^{[1
]}

Lee, Hyung Sub ^{[1
]}

Lee, Jung Won ^{[2
]}

Lee, Seung Eun ^{[2
]}

Cho, Yong Soo ^{[1
]}

机构：

[1] Yonsei Univ, Dept Mat Sci & Engn, Seoul 120749, South Korea

[2] Samsung Electromech, Corp R&D Inst, Suwon 442743, South Korea

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 2010年 / 93卷 / 09期

关键词：

GIANT PERMITTIVITY;

D O I：

10.1111/j.1551-2916.2010.03738.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Effects of hot pressing (HP) on the dielectric and grain-boundary characteristics of copper titanate (CaCu3Ti4O12 or CCTO) materials were studied with the comparison of conventionally prepared samples. HP at 1100 degrees C in N-2 atmosphere resulted in uniformly distributed smaller grain sizes and less Cu-rich grain boundaries, without the accompanying secondary CuO phase. The high effective permittivity of similar to 3 x 104 at 1 kHz, obtained in the HP sample having a relatively smaller grain size of similar to 2.4 mu m, is assumed to be associated with a higher dielectric constant of thinner grain-boundary phases. The low grain-boundary resistivities of 199-319 k center dot cm in the HP samples are likely induced by the N-2 atmosphere and less Cu-rich grain-boundary phase.

引用

页码：2419 / 2422

页数：4

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