Review of Uncertainty Quantification of Measurement and Computational Modeling in EMC Part II: Computational Uncertainty

被引:17
作者
Lallechere, Sebastien [1 ]
Carobbi, Carlo F. M. [2 ]
Arnaut, Luk R. [3 ]
机构
[1] Univ Clermont Auvergne, CNRS, SIGMA, Clermont Inst Pascal, F-63178 Aubiere, France
[2] Univ Firenze, Dept Informat Engn, I-50139 Florence, Italy
[3] Queen Mary Univ London, Sch Elect Engn & Comp Sci, London E1 4FZ, England
关键词
Electromagnetic compatibility; literature review; measurement uncertainty (MU); uncertainty quantification (UQ); POLYNOMIAL-CHAOS; RADIATED SUSCEPTIBILITY; EFFICIENT COMPUTATION; SENSITIVITY-ANALYSIS; FIELD; RELIABILITY; EXPRESSION; SYSTEMS; RISK;
D O I
10.1109/TEMC.2019.2904999
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In Part I of this two-part contribution on uncertainty quantification (UQ) in electromagnetic compatibility and electromagnetic interference, the current status of international standards relating to measurement uncertainty is reviewed. Here in Part II, a selection of recent developments in analytical and computational modeling of uncertainty and empirical UQ is reviewed.
引用
收藏
页码:1699 / 1706
页数:8
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