Thickness Dependent Interlayer Magnetoresistance in Multilayer Graphene Stacks

被引:5
作者
Bodepudi, S. C. [1 ]
Wang, X. [2 ]
Singh, A. P. [1 ]
Pramanik, S. [1 ]
机构
[1] Univ Alberta, Dept Elect & Comp Engn, Edmonton, AB T6G 2V4, Canada
[2] UESTC, Sch Microelect & Solid State Elect, Chengdu 610054, Sichuan, Peoples R China
基金
加拿大自然科学与工程研究理事会;
关键词
TO-PLANE MAGNETORESISTANCE; DIRAC-FERMIONS; LAYER; PHYSICS; GAS;
D O I
10.1155/2016/8163742
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Chemical Vapor Deposition grown multilayer graphene (MLG) exhibits large out-of-plane magnetoresistance due to interlayer magnetoresistance (ILMR) effect. It is essential to identify the factors that influence this effect in order to explore its potential in magnetic sensing and data storage applications. It has been demonstrated before that the ILMR effect is sensitive to the interlayer coupling and the orientation of the magnetic field with respect to the out-of-plane (C-axis) direction. In this work, we investigate the role of MLG thickness on ILMR effect. Our results show that the magnitude of ILMR effect increases with the number of graphene layers in the MLG stack. Surprisingly, thicker devices exhibit field induced resistance switching by a factor of at least similar to 10(7). This effect persists even at room temperature and to our knowledge such large magnetoresistance values have not been reported before in the literature at comparable fields and temperatures. In addition, an oscillatory MR effect is observed at higher field values. A physical explanation of this effect is presented, which is consistent with our experimental scenario.
引用
收藏
页数:10
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