A Soft X-ray Spectrometer using a Highly Dispersive Multilayer Grating

被引：3
|
作者：
Warwick, Tony [1 ]
Padmore, Howard [1 ]
Voronov, Dmitriy [1 ]
Yashchuk, Valeriy [1 ]
机构：
[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
来源：
SRI 2009: THE 10TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION | 2010年 / 1234卷
关键词：
RIXS; inelastic x-ray; scattering; spectrometer; multilayer; gratings;
D O I：
10.1063/1.3463327
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
There is a need for higher resolution spectrometers as a tool for inelastic x-ray scattering. Currently, resolving power around R=10,000 is advertised. Measured RIXS spectra are often limited by this instrumental resolution and higher resolution spectrometers using conventional gratings would be prohibitively large. We are engaged in a development program to build blazed multilayer grating structures for diffracting soft x-rays in high order. This leads to spectrometers with dispersion much higher than is possible using metal coated-gratings. The higher dispersion then provides higher resolution and the multilayer gratings are capable of operating away from grazing incidence as required. A spectrometer design is presented with a total length 3.8m and capable of 10(5) resolving power.
引用
收藏
页码：776 / 780
页数：5
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