Transmissivity testing of multilayer insulation at cryogenic temperatures

被引:10
|
作者
Johnson, W. L. [1 ]
Van Dresar, N. T. [2 ]
Chato, D. J. [2 ]
Demers, J. R. [3 ]
机构
[1] Glenn Res Ctr, Fluid & Cryogen Branch, Cleveland, OH USA
[2] Glenn Res Ctr Ret, Fluid & Cryogen Branch, Cleveland, OH USA
[3] Bakman Technol, Sherman Oaks, CA USA
关键词
Optical properties; Film transmission; Multilayer insulation;
D O I
10.1016/j.cryogenics.2017.07.002
中图分类号
O414.1 [热力学];
学科分类号
摘要
The problem of degraded emissivity of thin films at low temperatures has been a long observed phenomena. Previous efforts at measuring properties have suggested that transmission of energy through the films may play a key role in the thermal performance of multilayer insulation systems at low temperatures. Similarly, recent testing on tank applied systems has suggested a radiative degradation at low temperatures. Two different approaches were used to attempt to measure the transmission of energy through Mil at low temperatures. A laser based measurement system was set up to directly measure transmittance and a calorimetric based measurement system was used to measure relative emittance of a single layer between aluminum foil and double aluminized Mylar. Minimal transmission at long wavelengths were observed through standard MLI blanket materials at deposition thicknesses of even 35 nm. Where transmission was measured, it was too low to effect the performance of a multilayers system. Similarly, the calorimeter showed similar increases of emissivity for both standard blanket materials and aluminum foils. Multiple different methodologies of measurement have all yielded the same result: that there is no transmission through standard MLI blanket materials at wavelengths associated with temperatures as low as 2 K. Published by Elsevier Ltd. This is an open access article under the CC BY-NC-ND license
引用
收藏
页码:70 / 79
页数:10
相关论文
共 50 条
  • [31] Load Responsive Multilayer Insulation Performance Testing
    Dye, S.
    Kopelove, A.
    Mills, G. L.
    ADVANCES IN CRYOGENIC ENGINEERING, 2014, 1573 : 487 - 492
  • [32] ANALYSIS AND TESTING OF MULTILAYER AND AEROGEL INSULATION CONFIGURATIONS
    Johnson, W. L.
    Demko, J. A.
    Fesmire, J. E.
    ADVANCES IN CRYOGENIC ENGINEERING, VOLS 55A AND 55B, 2010, 1218 : 780 - +
  • [33] Electrical Insulation Paper and Its Physical Properties at Cryogenic Temperatures
    Tuncer, Enis
    Polizos, Georgios
    Sauers, Isidor
    James, D. Randy
    IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2011, 21 (03) : 1438 - 1440
  • [34] Electrical insulation characteristics in nitrogen gas and air at cryogenic temperatures
    Toyota, H
    Akamine, Y
    Matsuoka, S
    Hidaka, K
    IEEE/PES TRANSMISSION AND DISTRIBUTION CONFERENCE AND EXHIBITION 2002: ASIA PACIFIC, VOLS 1-3, CONFERENCE PROCEEDINGS: NEW WAVE OF T&D TECHNOLOGY FROM ASIA PACIFIC, 2002, : 1304 - 1309
  • [35] Standardization in cryogenic insulation systems testing and performance data
    Fesmire, James E.
    PROCEEDINGS OF THE 25TH INTERNATIONAL CRYOGENIC ENGINEERING CONFERENCE AND INTERNATIONAL CRYOGENIC MATERIALS CONFERENCE 2014, 2015, 67 : 1089 - 1097
  • [36] Study of the thermal performance of multilayer insulation used in cryogenic transfer lines
    Deng, Bicai
    Yang, Shaoqi
    Xie, Xiujuan
    Wang, Yunlong
    Bian, Xing
    Gong, Linghui
    Li, Qing
    CRYOGENICS, 2019, 100 : 114 - 122
  • [37] STRUCTURAL-ENVIRONMENTAL TESTS ON MULTILAYER INSULATION FOR CRYOGENIC SPACE VEHICLES
    NELSON, RS
    ANDERSON, JW
    JOURNAL OF SPACECRAFT AND ROCKETS, 1966, 3 (07) : 989 - &
  • [38] Optimization of variable density multilayer insulation for cryogenic application and experimental validation
    Wang, B.
    Huang, Y. H.
    Li, P.
    Sun, P. J.
    Chen, Z. C.
    Wu, J. Y.
    CRYOGENICS, 2016, 80 : 154 - 163
  • [39] On standards for mechanical testing of materials at cryogenic temperatures
    L. S. Novogrudskii
    V. A. Strizhalo
    Strength of Materials, 2010, 42 : 272 - 279
  • [40] APPARATUS FOR FATIGUE TESTING OF MATERIALS AT CRYOGENIC TEMPERATURES
    ABUSHENKOV, ID
    CHERNETSKII, VK
    ILICHEV, VY
    INDUSTRIAL LABORATORY, 1986, 52 (12): : 1142 - 1147