Crystal-Structure-Dependent Piezotronic and Piezo-Phototronic Effects of ZnO/ZnS Core/Shell Nanowires for Enhanced Electrical Transport and Photosensing Performance

被引:39
作者
Jeong, Sehee [1 ]
Kim, Min Woo [2 ]
Jo, Yong-Ryun [2 ]
Kim, Tae-Yun [3 ]
Leem, Young-Chul [2 ]
Kim, Sang-Woo [3 ]
Kim, Bong-Joong [2 ]
Park, Seong-Ju [1 ,2 ]
机构
[1] Gwangju Inst Sci & Technol, Dept Nanobio Mat & Elect, Gwangju 61005, South Korea
[2] Gwangju Inst Sci & Technol, Sch Mat Sci & Engn, Gwangju 61005, South Korea
[3] Sungkyunkwan Univ, Sch Adv Mat Sci & Engn, Suwon 16419, South Korea
关键词
ZnO/ZnS core/shell nanowire; piezotronic effect; piezo-phototronic effect; crystal-structure dependence; photosensing; INDIUM TIN OXIDE; WORK FUNCTION; PRESSURE SENSOR; ZNO NANOWIRES; PHOTODETECTOR; ULTRAVIOLET; ARRAYS; SHELL; PHOTOLUMINESCENCE; PHOTOCONDUCTIVITY;
D O I
10.1021/acsami.8b06192
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We report the crystal-structure-dependent piezotronic and piezo-phototronic effects of ZnO/ZnS core/shell nanowires (CS NWs) having different shell layer crystalline structures. The wurtzite (WZ) ZnO/WZ ZnS CS NWs showed higher electrical transport and photosensing properties under external strain than the WZ ZnO/zinc blende (ZB) ZnS CS NWs. The WZ ZnO/WZ ZnS CS NWs under a compressive strain of -0.24% showed 4.4 and 8.67 times larger increase in the output current (1.93 x 10(-4) A) and photoresponsivity (8.76 x 10(-1) A/W) than those under no strain. However, the WZ ZnO/ZB ZnS CS NWs under the same strain condition showed 3.2 and 2.16 times larger increase in the output current (1.13 x 10(-4) A) and photoresponsivity (2.16 x 10(-1) A/W) than those under no strain. This improvement is ascribed to strain-induced piezopolarization charges at both the WZ ZnO NWs and the grains of the WZ ZnS shell layer in WZ ZnO/WZ ZnS CS NWs, whereas piezopolarization charges are induced only in the ZnO core region of the WZ ZnO/ZB ZnS CS NWs. These charges can change the type-II band alignment in the ZnO and ZnS interfacial region as well as the Schottky barrier height at the junction between the semiconductor and the metal, thus facilitating electrical transport and reducing the recombination probability of charge carriers under UV irradiation.
引用
收藏
页码:28736 / 28744
页数:9
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