Fluctuations and dark count rates in superconducting NbN single-photon detectors

被引：10

作者：

Engel, A ^{[1
]}

Semenov, A ^{[1
]}

Hübers, HW ^{[1
]}

Il'in, K ^{[1
]}

Siegel, M ^{[1
]}

机构：

[1] Univ Zurich, Inst Phys, CH-8057 Zurich, Switzerland

来源：

Physica Status Solidi C - Conferences and Critical Reviews, Vol 2, No 5 | 2005年 / 2卷 / 05期

关键词：

D O I：

10.1002/pssc.200460809

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We measured the temperature- and current-dependence of dark count rates of a superconducting single-photon detector. The detector's key element is a 84 nm wide meander strip line fabricated from a 5 nm thick NbN film. Due to its reduced dimensions various types of fluctuations can cause temporal and localized transitions into a resistive state leading to dark count events. Adopting a recent refinement of the hot-spot model we achieve a satisfying description of the experimental dark count rates taking into account fluctuations of the Cooper-pair density and current-assisted unbinding of vortex-antivortex pairs. (c) 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

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页码：1668 / 1673

页数：6

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