Algorithm for Evaluating Errors in Recognition of Materials in X-Ray Testing System Containing X-Ray Sandwich Detectors

被引：2
|
作者：
Udod, V. A. [1 ]
Osipov, S. P. [2 ]
Nazarenko, S. Yu. [2 ]
机构：
[1] Tomsk State Univ, Tomsk 634050, Russia
[2] Tomsk Polytech Univ, Tomsk 634050, Russia
来源：
RUSSIAN JOURNAL OF NONDESTRUCTIVE TESTING | 2022年 / 58卷 / 01期
关键词：
X-ray radiation; algorithm; sandwich detector; dual energy method; material recognition; atomic number; ENERGY; IDENTIFICATION; OBJECTS;
D O I：
10.1134/S1061830922010065
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
We describe our proposed algorithm for statistical estimation of the error of the dual energy method due to the quantum nature of radiation as applied to an X-ray inspection system containing sandwich detectors. Its action is demonstrated using a specific example. Recommendations are given for the further use of the algorithm, in particular, for optimizing the structural elements of radiation sandwich detectors.
引用
收藏
页码：46 / 56
页数：11
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