SPI-specific analysis method and software overview

被引:30
作者
Diehl, R [1 ]
Baby, N
Beckmann, V
Connell, P
Dubath, P
Jean, P
Knödlseder, J
Roques, JP
Schanne, S
Shrader, C
Skinner, G
Strong, A
Sturner, S
Teegarden, B
von Kienlin, A
Weidenspointner, G
机构
[1] Max Planck Inst Extraterr Phys, D-85741 Garching, Germany
[2] Ctr Etud Spatiale Rayonnements, F-31028 Toulouse, France
[3] Integral Sci Data Ctr, CH-1290 Versoix, Switzerland
[4] Univ Birmingham, Birmingham, W Midlands, England
[5] CEA Saclay, Serv Astrophys, DSM DAPNIA, F-91191 Gif Sur Yvette, France
[6] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA
[7] Univ Tubingen, Inst Astron & Astrophys, D-72076 Tubingen, Germany
[8] Univ Space Res Assoc, Seabrook, MD 20706 USA
关键词
gamma-rays : observations; methods : data analysis;
D O I
10.1051/0004-6361:20031365
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
The SPI spectrometer on INTEGRAL features a camera system with 19 Ge detector modules, imaging photons through a tungsten coded mask. Background is reduced by an anticoincidence detector system surrounding these. The specifics of this instrument lead to data correction and analysis methods which are described here. Raw data for science analysis are detector event messages and spectra for different categories of detector hits and pulse shapes. Preprocessing combines calibrated spectra from these, which are then interpreted using the imaging and spectral response function for measured spectra where parts of the detector plane are occulted by the mask. Background dominates the overall signal, tailored background estimates and models are based on instrument-specific signatures, their correlations, and trends.
引用
收藏
页码:L117 / L121
页数:5
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