SMILETRAP - Atomic mass measurements with ppb accuracy by using highly charged ions

被引：2
|
作者：
Schwarz, T
Jertz, R
Stein, J
Bergstrom, I
Borgenstrand, H
Carlberg, C
Rouleau, G
Schuch, R
Soderberg, F
Bollen, G
Kluge, HJ
Mann, R
机构：
[1] UNIV STOCKHOLM,S-10405 STOCKHOLM,SWEDEN
[2] GSI DARMSTADT,W-6100 DARMSTADT,GERMANY
来源：
HYPERFINE INTERACTIONS | 1996年 / 99卷 / 1-3期
关键词：
D O I：
10.1007/BF02274911
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
In the SMILETRAP facility externally produced highly charged ions are captured in a Penning trap and utilized for high precision measurements of atomic masses. Accuracy tests on a ppb level have been performed, using highly charged carbon, oxygen and neon ions. In all cases hydrogen ions served as a reference for the calibration and monitoring of the magnetic field in the trap. Deviations smaller than 3 ppb from the expected results were found in mass measurements of the O-16 and Ne-20 atomic masses. The proton atomic mass, determined from the reference measurements on hydrogen ions, is in good agreement with the accepted value [1]. A direct mass measurement on the Kr-86-isotope, using trapped Kr-86(29)-ions is reported.
引用
收藏
页码：83 / 89
页数：7
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