Quantitative analysis of aluminum dross by the Rietveld method

被引:11
作者
Gomez, A. [1 ]
Lima, N. B. [2 ]
Tenorio, J. A. [1 ]
机构
[1] Univ Sao Paulo, Polytechn Sch, BR-05508900 Sao Paulo, Brazil
[2] IPEN CNEN SP, Nucl & Energy Res Inst, Xray Diffract Lab, Sao Paulo, Brazil
关键词
X-ray diffraction; Rietveld method; quantitative characterization; aluminum dross;
D O I
10.2320/matertrans.MRA2007129
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Aluminum white dross is a valuable material principally due to its high metallic aluminum content. The aim of this work is to develop a method for quantitative analysis of aluminum white dross with high accuracy. Initially, the material was separated into four granulometric fractions by means of screening. Two samples of each fraction were obtained, which were analyzed by means of X-ray fluorescence and energy dispersive spectroscopy in order to determine the elements present in the samples. The crystalline phases aluminum, corundum, spinel, defect spinel, diaoyudaoite, aluminum nitride, silicon and quartz low were identified by X-ray diffraction. The quantitative phase analysis was performed by fitting the X-ray diffraction profile with the Rietveld method using the GSAS software. The following quantitative results were found: 77.8% aluminum, 7.3% corundum, 2.6% spinel, 7.6% defect spinel, 1.8% diaoyudaoite, 2.9% aluminum nitride, and values not significant of quartz and silicon.
引用
收藏
页码:728 / 732
页数:5
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