Characterization of surface oxide layers formed on Fe-Alalloys by annealing under different atmospheres

被引:11
作者
Suzuki, Shigeru [1 ]
Yamamoto, Takamichi [1 ]
Shinoda, Kozo [1 ]
Sato, Shigeo
机构
[1] Tohoku Univ, Inst Multidisciplinary Res Adv Mat, Sendai, Miyagi 980, Japan
关键词
iron-based alloy; aluminum oxide; X-ray photoelectron spectroscopy; secondary-ion mass spectrometry; depth profiling;
D O I
10.1002/sia.2635
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
XPS and SIMS were used for characterizing the surface oxide layers formed on Fe - Al alloys during annealing under atmospheres with different partial pressures of oxygen, which were controlled by H2O/H-2 ratios in the gas. The XPS results showed that an aluminum oxide (Al2O3) layer was formed on the surfaces of samples annealed at a high temperature under a low partial pressure of oxygen, while such a layer was not formed on the surfaces of samples annealed under a high partial pressure of oxygen. SIMS depth profiles showed that the surfaces of samples annealed at high temperatures under a low partial pressure of oxygen were covered with a thin Al2O3 layer of approximately 50 nm thickness. It was also shown that oxygen penetrated the samples annealed under a high partial pressure of oxygen, and the depth profile of oxygen was correlated with that of aluminum. This indicates that internal oxidation of aluminum occurs in the samples annealed under a high partial pressure of oxygen. Grazing-incidence X-ray diffraction (GIXD) was also employed for analyzing the structure of the Al2O3 layer formed on the surface of samples annealed under a low partial pressure of oxygen. Copyright (c) 2008 John Wiley & Sons, Ltd.
引用
收藏
页码:311 / 314
页数:4
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