Differential Fault Analysis for Round-Reduced AES by Fault Injection

被引：16

作者：

Park, JeaHoon ^{[2
]}

Moon, SangJae ^{[3
]}

Choi, DooHo ^{[4
]}

Kang, YouSung ^{[4
]}

Ha, JaeCheol ^{[1
,5
]}

机构：

[1] Hoseo Univ, Dept Informat Secur, Asan, Choongnam, South Korea

[2] Kyungpook Natl Univ, Grad Sch Elect Engn & Comp Sci, Taegu, South Korea

[3] Kyungpook Natl Univ, Sch Elect Engn, Taegu, South Korea

[4] ETRI, Software Res Lab, Taejon, South Korea

[5] Hoseo Univ, Dept Informat & Secur, Asan, Choongnam, South Korea

来源：

ETRI JOURNAL | 2011年 / 33卷 / 03期

关键词：

AES; fault attack; differential fault attack; KEY SCHEDULE; ATTACK;

D O I：

10.4218/etrij.11.0110.0478

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a practical differential fault analysis method for the faulty Advanced Encryption Standard (AES) with a reduced round by means of a semi-invasive fault injection. To verify our proposal, we implement the AES software on the ATmega128 microcontroller as recommended in the standard document FIPS 197. We reduce the number of rounds using a laser beam injection in the experiment. To deduce the initial round key, we perform an exhaustive search for possible key bytes associated with faulty ciphertexts. Based on the simulation result, our proposal extracts the AES 128-bit secret key in less than 10 hours with 10 pairs of plaintext and faulty ciphertext.

引用

页码：434 / 442

页数：9

共 15 条

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