Reflection scanning near-field optical microscopy in ultrahigh vacuum

被引：4

作者：

Hoppe, S ^{[1
]}

Ctistis, G ^{[1
]}

Paggel, JJ ^{[1
]}

Fumagalli, P ^{[1
]}

机构：

[1] Free Univ Berlin, Inst Phys Expt, D-14195 Berlin, Germany

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2005年 / 76卷 / 06期

关键词：

D O I：

10.1063/1.1922789

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A reflection scanning near-field optical microscope with polarization-sensitive light detection for operation in ultrahigh vacuum is presented. All necessary stages to reach the final goal of subwavelength resolution in magneto-optics are considered step by step, validating our approach and demonstrating the usefulness of the final instrument. A number of problems are attacked and discussed, but some are only treated to an extent necessary to bring the instrument to operation. Sub-lambda resolution of a nonmagnetic polarization signal is demonstrated. (c) 2005 American Institute of Physics.

引用

页数：7

共 39 条

[11]

Eggers G, 1997, SURF INTERFACE ANAL, V25, P483, DOI 10.1002/(SICI)1096-9918(199706)25:7/8<483::AID-SIA251>3.0.CO

[12]

2-D

[13] Internal reflection mode scanning near-field optical microscopy with the tetrahedral tip on metallic samples [J].

Ferber, J ;

Fischer, UC ;

Hagedorn, N ;

Fuchs, H .

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1999, 69 (06) :581-589

[14] Quantitative determination of the local Kerr rotation by scanning near-field magneto-optic microscopy [J].

Fumagalli, P ;

Rosenberger, A ;

Eggers, G ;

Munnemann, A ;

Held, N ;

Guntherodt, G .

APPLIED PHYSICS LETTERS, 1998, 72 (22) :2803-2805

[15] SUPERRESOLUTION FLUORESCENCE NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].

HAROOTUNIAN, A ;

BETZIG, E ;

ISAACSON, M ;

LEWIS, A .

APPLIED PHYSICS LETTERS, 1986, 49 (11) :674-676

[16]

HECHT B, 1996, THESIS U BASEL

[17] SCANNING NEAR-FIELD OPTICAL MICROSCOPY [J].

HEINZELMANN, H ;

POHL, DW .

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 59 (02) :89-101

[18] Comparison of mechanically drawn and protection layer chemically etched optical fiber tips [J].

Hoffmann, P ;

Dutoit, B ;

Salathe, RP .

ULTRAMICROSCOPY, 1995, 61 (1-4) :165-170

[19] Spectroscopy of the shear force interaction in scanning near-field optical microscopy [J].

Hoppe, S ;

Ctistis, G ;

Paggel, JJ ;

Fumagalli, P .

ULTRAMICROSCOPY, 2005, 102 (03) :221-226

[20]

HOPPE S, 2004, THESIS FREIE U BERLI

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