Reflection scanning near-field optical microscopy in ultrahigh vacuum

被引：4

作者：

Hoppe, S ^{[1
]}

Ctistis, G ^{[1
]}

Paggel, JJ ^{[1
]}

Fumagalli, P ^{[1
]}

机构：

[1] Free Univ Berlin, Inst Phys Expt, D-14195 Berlin, Germany

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2005年 / 76卷 / 06期

关键词：

D O I：

10.1063/1.1922789

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A reflection scanning near-field optical microscope with polarization-sensitive light detection for operation in ultrahigh vacuum is presented. All necessary stages to reach the final goal of subwavelength resolution in magneto-optics are considered step by step, validating our approach and demonstrating the usefulness of the final instrument. A number of problems are attacked and discussed, but some are only treated to an extent necessary to bring the instrument to operation. Sub-lambda resolution of a nonmagnetic polarization signal is demonstrated. (c) 2005 American Institute of Physics.

引用

页数：7

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