Deformation characteristics of ultra-thin liquid film considering temperature and film thickness dependence of surface tension Three-dimensional analyses by the unsteady and linearized long wave equation

被引：27

作者：

Matsuoka, Hiroshige ^{[1
]}

Oka, Koji ^{[1
]}

Yamashita, Yusuke ^{[1
]}

Saeki, Fumihiro ^{[1
]}

Fukui, Shigehisa ^{[1
]}

机构：

[1] Tottori Univ, Dept Mech & Aerosp Engn, Grad Sch Engn, Tottori 6808552, Japan

来源：

MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS | 2011年 / 17卷 / 5-7期

关键词：

Surface Tension; Liquid Film; Hamaker Constant; Liquid Film Thickness; Liquid Height;

D O I：

10.1007/s00542-011-1223-0

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Thermocapillary deformations of an ultra-thin liquid film caused by temperature distribution were three-dimensionally analyzed using the unsteady and linearized long wave equation considering the temperature and film thickness dependence of surface tension. The temperature and film thickness dependence equation for the surface tension of a liquid was firstly established. The temperature dependence of the surface tension was obtained experimentally using a surface tensiometer and the film thickness dependence was obtained theoretically from the corrected van der Waals pressure equation for a symmetric multi-layer system. Time evolutions of depression and groove of the ultra-thin liquid film caused by local heating were obtained quantitatively.

引用

页码：983 / 990

页数：8

共 9 条

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