High-aspect ratio needle probes for combined scanning electrochemical microscopy-Atomic force microscopy

被引：29
|
作者：
Wain, Andrew J. [1 ]
Cox, David [1 ,2 ]
Zhou, Shengqi [1 ]
Turnbull, Alan [1 ]
机构：
[1] Natl Phys Lab, Teddington TW11 0LW, Middx, England
[2] Univ Surrey, Adv Technol Inst, Surrey GU2 7XH, England
来源：
ELECTROCHEMISTRY COMMUNICATIONS | 2011年 / 13卷 / 01期
关键词：
SECM; AFM; Combined SECM-AFM; Needle probes; Nanoscale electrochemistry; TOPOGRAPHY; SECM;
D O I：
10.1016/j.elecom.2010.11.018
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
The development and characterisation of high-aspect ratio needle probes for combined scanning electrochemical microscopy-atomic force microscopy (SECM-AFM) is described. Commercially available coated metallic needle probes have been modified by a simple procedure to yield probes with an addressable nano-disk electrode integrated into the tip apex. The probes behaved well electrochemically, with a typical electrochemical radius of approximately 140 nm and the preliminary application of these probes to high-resolution topographical and electrochemical imaging was demonstrated. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码：78 / 81
页数：4
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