An integrated method for measurement of diamond tools based on AFM

被引:6
作者
Yue, Xiaobin [1 ]
Lei, Dajiang [1 ]
Cui, Hailong [1 ]
Zhang, Xiaofeng [1 ]
Xu, Min [2 ]
Kong, Lingbao [2 ]
机构
[1] China Acad Engn Phys, Inst Machinery Mfg Technol, Mianyang, Peoples R China
[2] Fudan Univ, Shanghai Engn Res Ctr Ultraprecis Opt Mfg, Shanghai, Peoples R China
来源
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY | 2017年 / 50卷
基金
中国国家自然科学基金;
关键词
Diamond tool; Measurement and characterization; AFM; Multiple indexes; Ultra-precision machining; CUTTING TOOLS; ULTIMATE SHARPNESS; SURFACE GENERATION; EDGE RADIUS; MACHINE; WEAR; GEOMETRIES; ROUGHNESS; VIBRATION;
D O I
10.1016/j.precisioneng.2017.04.021
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The measurement and evaluation technology of high precision diamond tools is critically important for supporting the ultra-precision machining. In practical cutting process, the edge profile quality of the diamond tool, including sharpness, micro defects, roughness and tip arc waviness, greatly affects the cutting quality. It is very difficult to measure and evaluate the diamond tool edge profile due to the high precision of tool edge profile and complexity of various measurement parameters. In this paper, an integrated method for measurement and characterization of diamond tools is proposed, which is based on an Atomic Force Microscope (AFM) module. Multiple technical indexes of diamond tools are obtained and validated based on the presented research and cutting experiments, and the evaluation model for each technical index is also proposed. The integrated measurement equipment, including an AFM, precision adjustment device and aerostatic bearings, has been established based on the accuracy requirement of measurement parameters. The edge sharpness, micro defects, surface roughness and tip arc waviness have been obtained based on the evaluation model and experimental data. The experimental results show that the measurement accuracy meets the requirements of the comprehensive evaluation of the diamond tool edge profile. The research work will also contribute to the development of ultra-precision machine. (C) 2017 Elsevier Inc. All rights reserved.
引用
收藏
页码:132 / 141
页数:10
相关论文
共 50 条
  • [31] Nano-wear of the diamond AFM probing tip under scratching of silicon, studied by AFM
    Khurshudov, Andrei G.
    Kato, Koji
    Koide, Hiroyuki
    TRIBOLOGY LETTERS, 1996, 2 (04) : 345 - 354
  • [32] Recent advances in design and preparation of micro diamond cutting tools
    Liu, Hanzhong
    Yan, Yongda
    Cui, Jiwen
    Geng, Yanquan
    Sun, Tao
    Luo, Xichun
    Zong, Wenjun
    INTERNATIONAL JOURNAL OF EXTREME MANUFACTURING, 2024, 6 (06)
  • [33] Wear resistant CVD diamond tools for turning of sintered hardmetals
    Belmonte, M
    Ferro, P
    Fernandes, AJS
    Costa, FM
    Sacramento, J
    Silva, RF
    DIAMOND AND RELATED MATERIALS, 2003, 12 (3-7) : 738 - 743
  • [34] Development of a Next Generation of Diamond Tools Based on Superhard Materials with a Nanomodified Binder for Steel and Cast Iron Machining
    Loginov, P. A.
    Sidorenko, D. A.
    Levashov, E. A.
    Andreev, V. A.
    RUSSIAN JOURNAL OF NON-FERROUS METALS, 2018, 59 (03) : 341 - 351
  • [35] A comparative study on FeAl and NiAl bonded diamond tools for dry grinding based on wear characteristics at elevated temperature
    Peng, Jia-wan
    Zhang, Feng-lin
    Zhou, Yu-mei
    Wu, Shang-hua
    Zhao, Zhen-yu
    Tang, Hong-qun
    Pan, Xiao-yi
    WEAR, 2023, 516
  • [36] Quantitative electrostatic force measurement in AFM
    Jeffery, S
    Oral, A
    Pethica, JB
    APPLIED SURFACE SCIENCE, 2000, 157 (04) : 280 - 284
  • [37] Phase modulation dynamic AFM measurement system based on tuning fork probe
    Guo Tong
    Chen Weijia
    Wu Zhichao
    Chen Jinping
    Fu Xing
    Hu Xiaotang
    SIXTH INTERNATIONAL SYMPOSIUM ON PRECISION MECHANICAL MEASUREMENTS, 2013, 8916
  • [38] Radius and roundness measurement of micro spheres based on a set of AFM surface scans
    Oertel, Erik
    Manske, Eberhard
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2021, 32 (04)
  • [39] A Miniature Piezoresistive Transducer and a New Temperature Compensation Method for New Developed SEM-Based Nanoindentation Instrument Integrated With AFM Function
    Gu, Sen
    Zhu, Junhui
    Pan, Peng
    Wang, Yong
    Ru, Changhai
    IEEE ACCESS, 2020, 8 : 104326 - 104335
  • [40] Effects of surface topography measurement conditions on AFM-Based nanowear tests
    Ohkubo, Y
    Matsuhashi, S
    Tajima, H
    Umemura, S
    Hirono, S
    Kaneko, R
    JOURNAL OF THE JAPAN INSTITUTE OF METALS, 2003, 67 (06) : 281 - 285