Step contrast in low energy electron microscopy

被引：53

作者：

Chung, WF ^{[1
]}

Altman, MS ^{[1
]}

机构：

[1] Hong Kong Univ Sci & Technol, Dept Phys, Kowloon, Peoples R China

来源：

ULTRAMICROSCOPY | 1998年 / 74卷 / 04期

关键词：

low energy electron microscopy (LEEM); image simulation; step-phase contrast; surface step;

D O I：

10.1016/S0304-3991(98)00043-6

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A wave-optical. model for surface step-phase contrast in low energy electron microscopy (LEEM) is presented. Step contrast is calculated as the interference of the Fresnel diffracted waves from terrace edges which meet at a step. Instrumental resolution and beam coherence, i.e., as defined by source extension and energy spread, are also considered. Model predictions are compared to experimental observations of steps on the W(1 1 0), Mo(1 0 0) and Si(1 1 1) surfaces. This work allows for the routine identification of the step sense with LEEM. (C) 1998 Published by Elsevier Science B.V. All rights reserved.

引用

页码：237 / 246

页数：10

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