Relationship between Raman spectra and crystallinity of CdS films grown by cathodic electrodeposition

被引：24

作者：

Shirai, K ^{[1
]}

Moriguchi, Y ^{[1
]}

Ichimura, M ^{[1
]}

Usami, A ^{[1
]}

Saji, M ^{[1
]}

机构：

[1] NAGOYA INST TECHNOL,CTR COOPERAT RES,SHOWA KU,NAGOYA,AICHI 466,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1996年 / 35卷 / 4A期

关键词：

Raman scattering; CdS; electrodeposition; annealing; Auger electron spectroscopy; X-ray diffraction;

D O I：

10.1143/JJAP.35.2057

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

CdS films were cathodically electrodeposited from acidic solutions (pH=2.5) containing CdSO4 and Na2S2O3. Raman scattering of these films was measured using the 514.5 nm line of an Ar ion laser as the light source. The longitudinal-optical (LO) phonon peak of CdS was observed between 300-310 cm(-1). The full width at half-maximum (FWHM) of the peak was a large value of 18.2 cm(-1) for as-deposited films, but decreased to 12.7 cm(-1) after the films were annealed at 500 degrees C. These results are consistent with those of other structural and optical characterizations, and thus the Raman spectroscopy was found to be useful for the characterization of the electrodeposited CdS films.

引用

页码：2057 / 2060

页数：4

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