Low Resistance Metal Contacts to MoS2 Devices with Nickel-Etched-Graphene Electrodes

被引:192
作者
Leong, Wei Sun [1 ]
Luo, Xin [2 ,3 ,4 ]
Li, Yida [1 ]
Khoo, Khoong Hong [2 ,3 ,4 ]
Quek, Su Ying [2 ,3 ]
Thong, John T. L. [1 ]
机构
[1] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117583, Singapore
[2] Natl Univ Singapore, Ctr Adv Mat 2D, Dept Phys, Singapore 117546, Singapore
[3] Natl Univ Singapore, Graphene Res Ctr, Singapore 117546, Singapore
[4] Inst High Performance Comp, Singapore 138632, Singapore
基金
新加坡国家研究基金会;
关键词
Transition metal dichalcogenide; molybdenum disulfide; contact resistance graphene; field-effect transistor; heterostructure; FIELD-EFFECT TRANSISTORS;
D O I
10.1021/nn506567r
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
We report an approach to achieve low-resistance contacts to MoS2 transistors with the intrinsic performance of the MoS2 channel preserved. Through a dry transfer technique and a metal-catalyzed graphene treatment process, nickel-etched-graphene electrodes were fabricated on MoS2 that yield contact resistance as low as 200 Omega center dot mu m. The substantial contact enhancement (similar to 2 orders of magnitude), as compared to pure nickel electrodes, is attributed to the much smaller work function of nickel-graphene electrodes, together with the fact that presence of zigzag edges in the treated graphene surface enhances tunneling between nickel and graphene. To this end, the successful fabrication of a clean grapheneMoS(2) interface and a low resistance nickelgraphene interface is critical for the experimentally measured low contact resistance. The potential of using graphene as an electrode interlayer demonstrated in this work paves the way toward achieving high performance next-generation transistors.
引用
收藏
页码:869 / 877
页数:9
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