Preparation of H-bar cross-sectional specimen for in situ TEM straining experiments: A FIB-based method applied to a nitrided Ti-6Al-4V alloy

被引：13

作者：

Castany, P. ^{[1
,2
]}

Legros, M. ^{[2
]}

机构：

[1] INSA Rennes, UMR CNRS SCR Chim Met 6226, F-35708 Rennes 7, France

[2] CEMES CNRS, F-31055 Toulouse 4, France

来源：

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2011年 / 528卷 / 03期

关键词：

In situ straining; Transmission electron microscopy (T'EM); Focused ion beam (FIB); Dislocation dynamics; Titanium alloy; Nitridation; THIN-FILMS; SINGLE-CRYSTAL; TITANIUM-ALLOY; DEFORMATION; MICROSCOPY; MECHANISMS; POLYIMIDE; BEHAVIOR; FRACTURE;

D O I：

10.1016/j.msea.2010.10.025

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The in situ tensile straining of cross-sectional specimens inside a TEM is intrinsically very difficult to perform despite its obvious interest to study interfaces of surface treated materials. We have combined a FIB-based method to produce H-bar specimens of a nitrided Ti-6Al-4V alloy and in situ TEM straining stage, to successfully study the plastic deformation mechanisms that are activated close to the nitrided surface in the Ti-based alloy. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：1367 / 1371

页数：5