Visualization of optical phenomena caused by multilayer films based on wave optics

被引：17

作者：

Hirayama, H

Kaneda, K

Yamashita, H

Yamaji, Y

Monden, Y

机构：

[1] Hiroshima Univ, Fac Engn, Higashihiroshima 7398527, Japan

[2] Shimane Univ, Interdisciplinary Fac Sci & Engn, Matsue, Shimane 6908504, Japan

来源：

VISUAL COMPUTER | 2001年 / 17卷 / 02期

关键词：

multilayer thin film; multiple reflection and refraction; interference; complex refractive index; composite reflectance and transmittance;

D O I：

10.1007/PL00013402

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

This paper proposes a method for rendering objects coated with multilayer thin films, taking into consideration multiple reflection and refraction, interference, and absorption of light inside the films. The proposed method is based on wave optics, and it can accurately visualize the optical effects of multilayer films consisting of not only dielectric materials, but also metallic and semiconductive materials. Optical properties of a SiO2 film coating on a silicon base, and several kinds of multilayer films coating windowpanes, glasses, or teapots are visualized to demonstrate the usefulness of the proposed method.

引用

页码：106 / 120

页数：15