Identification of A- and B-Site Cation Vacancy Defects in Perovskite Oxide Thin Films

被引：161

作者：

Keeble, D. J. ^{[1
]}

Wicklein, S. ^{[2
]}

Dittmann, R. ^{[2
]}

Ravelli, L. ^{[2
]}

Mackie, R. A. ^{[1
]}

Egger, W. ^{[3
]}

机构：

[1] Univ Dundee, Carnegie Lab Phys, Sch Engn Phys & Math, Dundee DD1 4HN, Scotland

[2] Forschungszentrum Julich, Inst Festkoperforsch, D-52425 Julich, Germany

[3] Univ Bundeswehr Munchen, D-85577 Neubiberg, Germany

来源：

PHYSICAL REVIEW LETTERS | 2010年 / 105卷 / 22期

关键词：

SRTIO3; ELECTRONICS;

D O I：

10.1103/PhysRevLett.105.226102

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Cation vacancies on both sublattices (V-Ti, V-Sr) have been identified in homoepitaxial pulsed laser deposited SrTiO3 films using high intensity variable energy positron annihilation lifetime spectroscopy (PALS) measurements. Film nonstoichiometry was varied by varying laser fluence. PALS showed that on increasing the fluence above the Ti/Sr similar to 1 value, the concentration ratio [V-Sr]/[V-Ti] systematically increased. Reducing the fluence into the Ti-poor region below resulted in additional vacancy cluster defect formation. Vacancy concentrations greater than similar to 50 ppm were observed in all films.

引用

页数：4

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