Thermo-mechanical transduction suitable for high-speed scanning probe imaging and lithography

被引:23
作者
Angelov, T. [1 ]
Roeser, D. [2 ]
Ivanov, T. [1 ]
Gutschmidt, S. [3 ]
Sattel, T. [2 ]
Rangelow, I. W. [1 ]
机构
[1] Ilmenau Univ Technol, Dept Micro & Nanoelect, Ilmenau, Germany
[2] Ilmenau Univ Technol, Mechatron Grp, Ilmenau, Germany
[3] Univ Canterbury, Dept Mech Engn, Christchurch, New Zealand
关键词
Thermally actuated piezoresistive cantilever; Active cantilever; Cantilever array; Atomic force microscope (AFM); ATOMIC-FORCE MICROSCOPE; CANTILEVER ARRAY;
D O I
10.1016/j.mee.2016.01.005
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Microelectromechanical systems (MEMS) with integrated read-out and actuation are very useful tools for a wide variation of applications, especially in scanning probe microscopy (SPM) and lithography (SPL). They avoid the use of conventional optical beam deflection techniques or external excitation and are suitable for massively parallel scanning probe solutions and biochemical sensors. Such arrays of beams offer an increased throughput to scan large areas in SPM and SPL. However, the fabrication technology of such complex MEMS requires careful design of all components. This paper presents a comparison between analytical, numerical and experimental data of a cantilever with integrated thermal actuator and piezoresistive sensor, suitable for fast SPM and SPL. The focus of this work lies on the efficiency of the actuator, to achieve a high static displacement, which is required for an array operation. To maximize this displacement, two material compositions for a varying geometry of the beam's layers are analyzed. With a scanning electron microscope and a laser vibrometer an increased displacement of the beam about 10 pm can be presented, which is in a good agreement with our theoretical predictions. (c) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码:1 / 7
页数:7
相关论文
共 29 条
[1]   Micromachined piezoresistive cantilever array with integrated resistive microheater for calorimetry and mass detection [J].
Abedinov, N ;
Grabiec, P ;
Gotszalk, T ;
Ivanov, T ;
Voigt, J ;
Rangelow, IW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2001, 19 (06) :2884-2888
[2]  
Ahmad A., SPIE
[3]   Fast atomic force microscopy with self-transduced, self-sensing cantilever [J].
Ahmad, Ahmad ;
Ivanov, Tzvetan ;
Angelov, Tihomir ;
Rangelow, Ivo W. .
JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 2015, 14 (03)
[4]   Force measurements with the atomic force microscope: Technique, interpretation and applications [J].
Butt, HJ ;
Cappella, B ;
Kappl, M .
SURFACE SCIENCE REPORTS, 2005, 59 (1-6) :1-152
[5]   VLSI-NEMS chip for parallel AFM data storage [J].
Despont, M ;
Brugger, J ;
Drechsler, U ;
Dürig, U ;
Häberle, W ;
Lutwyche, M ;
Rothuizen, H ;
Stutz, R ;
Widmer, R ;
Binnig, G ;
Rohrer, H ;
Vettiger, P .
SENSORS AND ACTUATORS A-PHYSICAL, 2000, 80 (02) :100-107
[6]   Study on electrothermally actuated cantilever array for nanolithography [J].
Fu JianYu ;
Chen DaPeng ;
Ye TianChun .
SCIENCE CHINA-TECHNOLOGICAL SCIENCES, 2010, 53 (05) :1184-1189
[7]  
Hetnarski R. B., 2008, THERMAL STRESSES ADV, V158
[8]  
Ivanov, 2004, THESIS
[9]   Quantum size aspects of the piezoresistive effect in ultra thin piezoresistors [J].
Ivanov, T ;
Gotszalk, T ;
Sulzbach, T ;
Rangelow, IW .
ULTRAMICROSCOPY, 2003, 97 (1-4) :377-384
[10]  
Judy J., 2002, Materials Research Society Symposium Proceedings, P23