Based on the Oliver-Pharr framework, an iteration scheme is proposed to continuously evaluate the hardness during monotonic loading in nanoindentation. The new method was applied to measure the hardness of various crystalline materials including Al, Cu, Ni3Al(Cr,B) and MgO, where an obvious Indentation Size Effect (ISE) was observed. In a-Se and PP, no ISE was observed when using exponential loading schemes at constant strain rates. The new method therefore produced the correct ISE behaviours in various materials under different loading situations.
机构:
GM Corp, Global Res & Dev Operat, Phys & Phys Chem Dept, Warren, MI 48090 USAGM Corp, Global Res & Dev Operat, Phys & Phys Chem Dept, Warren, MI 48090 USA
Cheng, YT
;
Cheng, CM
论文数: 0引用数: 0
h-index: 0
机构:GM Corp, Global Res & Dev Operat, Phys & Phys Chem Dept, Warren, MI 48090 USA
机构:
IBM Corp, Div Gen Prod, San Jose, CA 95193 USA
Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USAIBM Corp, Div Gen Prod, San Jose, CA 95193 USA
Doerner, M. F.
;
Nix, W. D.
论文数: 0引用数: 0
h-index: 0
机构:
Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USAIBM Corp, Div Gen Prod, San Jose, CA 95193 USA
机构:
GM Corp, Global Res & Dev Operat, Phys & Phys Chem Dept, Warren, MI 48090 USAGM Corp, Global Res & Dev Operat, Phys & Phys Chem Dept, Warren, MI 48090 USA
Cheng, YT
;
Cheng, CM
论文数: 0引用数: 0
h-index: 0
机构:GM Corp, Global Res & Dev Operat, Phys & Phys Chem Dept, Warren, MI 48090 USA
机构:
IBM Corp, Div Gen Prod, San Jose, CA 95193 USA
Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USAIBM Corp, Div Gen Prod, San Jose, CA 95193 USA
Doerner, M. F.
;
Nix, W. D.
论文数: 0引用数: 0
h-index: 0
机构:
Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USAIBM Corp, Div Gen Prod, San Jose, CA 95193 USA