Electron microscopy investigation of structural transformations in tungsten oxide (WO3) thin films

被引：11

作者：

Ramana, CV ^{[1
]}

Utsunomiya, S

Ewing, RC

Julien, CM

Becker, U

机构：

[1] Univ Michigan, Dept Geol Sci, Nanosci & Surface Chem Res Grp, Ann Arbor, MI 48109 USA

[2] Univ Michigan, Dept Mat Sci & Engn, Ann Arbor, MI 48109 USA

[3] Univ Paris 06, LMDH, F-75015 Paris, France

来源：

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2005年 / 202卷 / 10期

关键词：

D O I：

10.1002/pssa.200521076

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The phase transformations in tungsten oxide (WO3) thin films have been investigated in the temperature range of 30-500 degrees C using transmission electron microscopy (TEM) and selected area electron diffraction (SAED) measurements. The results indicate that the phase transitions in WO3 thin films occur in sequence exhibiting various crystal phases above room temperature in the order: monoclinic -> orthorhombic -> hexagonal. The crystallographic distortions and tilting of the WO6 octahedra are responsible for the phase transitions and significantly affect the electronic properties and, hence, the device applications of WO3. (c) 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

引用

页码：R108 / R110

页数：3

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