Statistical properties of SEE rate calculation in the limits of large and small event counts

被引：20
作者：
Ladbury, R. [1 ]
机构：
[1] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2007年 / 54卷 / 06期
关键词：
quality assurance; radiation effects; reliability estimation;
D O I：
10.1109/TNS.2007.910035
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We develop a Maximum Likelihood method for bounding single-event effect (SEE) rates at a particular confidence level. The method is useful for test planning, reliability estimates and investigating rare SEE modes and part-to-part and lot-to-lot variability.
引用
收藏
页码：2113 / 2119
页数：7
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