Statistical properties of SEE rate calculation in the limits of large and small event counts

被引：20

作者：

Ladbury, R. ^{[1
]}

机构：

[1] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2007年 / 54卷 / 06期

关键词：

quality assurance; radiation effects; reliability estimation;

D O I：

10.1109/TNS.2007.910035

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We develop a Maximum Likelihood method for bounding single-event effect (SEE) rates at a particular confidence level. The method is useful for test planning, reliability estimates and investigating rare SEE modes and part-to-part and lot-to-lot variability.

引用

页码：2113 / 2119

页数：7

共 9 条

[1]

*EL IND ASS ENG DE, 1996, TEST PROC MEAS SINGL

[2]

Garthwaite P., 1995, Statistical Inference

[3] Statistical methods for large flight lots and ultra-high reliability applications [J].

Ladbury, R ;

Gorelick, JL .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2005, 52 (06) :2630-2637

[4] HARDNESS ASSURANCE FOR SPACE SYSTEM MICROELECTRONICS [J].

PEASE, RL ;

ALEXANDER, DR .

RADIATION PHYSICS AND CHEMISTRY, 1994, 43 (1-2) :191-204

[5]

Petersen E., 1997, IEEE NSREC SHORT COU

[6] SEE rate calculations using the effective flux approach and a generalized figure of merit approximation [J].

Petersen, EL .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1995, 42 (06) :1995-2003

[7] SUGGESTED SINGLE EVENT UPSET FIGURE OF MERIT [J].

PETERSEN, EL ;

LANGWORTHY, JB ;

DIEHL, SE .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4533-4539

[8] CREME96: A revision of the Cosmic Ray Effects on Micro-Electronics code [J].

Tylka, AJ ;

Adams, JH ;

Boberg, PR ;

Brownstein, B ;

Dietrich, WF ;

Flueckiger, EO ;

Petersen, EL ;

Shea, MA ;

Smart, DF ;

Smith, EC .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1997, 44 (06) :2150-2160

[9]

2007, CREME96 HOMEPAGE

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