A software test program generator for verifying system-on-chips

被引:11
作者
Cheng, A [1 ]
Lim, CC [1 ]
Parashkevov, A [1 ]
机构
[1] Univ Adelaide, Sch Elect & Elect Engn, Adelaide, SA 5005, Australia
来源
HLDVT'05: TENTH ANNUAL IEEE INTERNATIONAL HIGH-LEVEL DESIGN VALIDATION AND TEST WORKSHOP, PROCEEDINGS | 2005年
关键词
D O I
10.1109/HLDVT.2005.1568818
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Design verification is crucial for successful systems-on-chips (SoCs). However, validating and proving the correctness of SoCs is often a bottleneck in the design project. This paper presents a novel technique to test the SoC at the system level using software application based programs. Our Software Application Level Verification Methodology (SALVEM) employs test programs composed of dynamic sequences of software code segments. The SALVEM system implements a test generator to create these software test programs automatically. Experiments were conducted applying SALVEM tests to the Altera Nios SoC. A feedback verification flow is also feasible in our SALVEM system. SALVEM test runs are analyzed to direct the test generator toward important SoC scenarios.
引用
收藏
页码:79 / 86
页数:8
相关论文
共 12 条
[1]  
*ALT INC, 2003, NIOS HARDW DEV TUT V
[2]   Industrial experience with test generation languages for processor verification [J].
Behm, M ;
Ludden, J ;
Lichtenstein, Y ;
Rimon, M ;
Vinov, M .
41ST DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2004, 2004, :36-40
[3]   AVPGEN - A TEST GENERATOR FOR ARCHITECTURE VERIFICATION [J].
CHANDRA, A ;
IYENGAR, V ;
JAMESON, D ;
JAWALEKAR, R ;
NAIR, I ;
ROSEN, B ;
MULLEN, M ;
YOON, J ;
ARMONI, R ;
GEIST, D ;
WOLFSTHAL, Y .
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 1995, 3 (02) :188-200
[4]  
CHANDRA AK, 1994, PR IEEE COMP DESIGN, P454, DOI 10.1109/ICCD.1994.331949
[5]  
CHENG A, 2004, 2 IEEE INT WORKSH EL, P237
[6]  
*COLL INT RES, 2002, 2002 IC ASIC FUNCT V
[7]  
Corno F, 2003, DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, PROCEEDINGS, P1006
[8]   Evolutionary test program induction for microprocessor design verification [J].
Corno, F ;
Cumani, G ;
Reorda, MS ;
Squillero, G .
PROCEEDINGS OF THE 11TH ASIAN TEST SYMPOSIUM (ATS 02), 2002, :368-373
[9]   Code generation and analysis for the functional verification of microprocessors [J].
Hosseini, A ;
Mavroidis, D ;
Konas, P .
33RD DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 1996, 1996, :305-310
[10]  
HUBERT H, 1998, SURVEY HW SW COSIMUL