共 10 条
[1]
BRUENGER WH, 1995, J VAC SCI TECHNOL B, V13, P2561
[2]
BRUENGER WH, 1994, J VAC SCI TECHNOL B, V12, P3547
[3]
Buchmann L.-M., 1992, Journal of Microelectromechanical Systems, V1, P116, DOI 10.1109/84.186390
[4]
DUBNER AD, 1992, J VAC SCI TECHNOL B, V12, P3212
[5]
EXPERIMENTAL INVESTIGATION OF STOCHASTIC SPACE-CHARGE EFFECTS ON PATTERN RESOLUTION IN ION PROJECTION LITHOGRAPHY SYSTEMS
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1994, 12 (06)
:3533-3538
[7]
HOFFMANN K, 1982, MICROCIRCUIT ENG, V82, P165
[8]
ION-BEAM EXPOSURE PROFILES IN PMMA-COMPUTER SIMULATION
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1981, 19 (04)
:1259-1263
[9]
Loschner H., 1994, Microlithography World, V3, P4
[10]
STANGL G, COMMUNICATION