The History and Future of X-ray Microscopy

被引：54
作者：
Kirz, J. [1 ,2 ]
Jacobsen, C. [2 ]
机构：
[1] Lawrence Berkeley Lab, Adv Light Source, 1 Cyclotron Rd, Berkeley, CA 94720 USA
[2] SUNY Stony Brook, Dept Phys & Astron, Stony Brook, NY 11794 USA
来源：
9TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY | 2009年 / 186卷
关键词：
ZONE PLATES; COMPUTED-TOMOGRAPHY; CHEMICAL CONTRAST; RESOLUTION; SPECTROMICROSCOPY; NANOFABRICATION; SPECTROSCOPY; LENSES; XANES;
D O I：
10.1088/1742-6596/186/1/012001
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
We take a somewhat whimsical look at the history of X-ray microscopy, and extrapolate some trends into the future.
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页数：11
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