Characteristics of fault diagnosis for analog circuits based on preset test

被引：3
作者：
Miura, Y [1 ]
机构：
[1] Tokyo Metropolitan Univ, Grad Sch Engn, Tokyo 158, Japan
来源：
DFT 2005: 20TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS | 2005年
关键词：
D O I：
10.1109/DFTVS.2005.21
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
We have proposed a method for diagnosing analog circuits, which is realized by combining the operation-region model and the X-Y zoning method In the method, since we developed a data processing method to handle data discretely, we cloud implement a diagnosis procedure based on the preset test which is a diagnostic method for digital circuits. In this paper we analyze results of the proposed diagnosis method by changing several parameters for diagnosing a circuit and show their characteristics. Moreover, we propose a new data processing method to obtain a short diagnostic sequence length. We demonstrate the effectiveness of the proposed method by applying it to ITC'97 benchmark circuits with hard faults and soft faults.
引用
收藏
页码：573 / 581
页数：9
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