A 70nW, 0.3V Temperature Compensation Voltage Reference Consisting of Subthreshold MOSFETs in 65nm CMOS Technology

被引:0
作者
Lu, Ting-Chou [1 ,2 ,3 ]
Ker, Ming-Dou [2 ,3 ]
Zan, Hsiao-Wen [4 ,5 ]
机构
[1] Ind Technol Res Inst, Informat & Commun Res Labs, Hsinchu, Taiwan
[2] Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu, Taiwan
[3] Natl Chiao Tung Univ, Inst Elect, Hsinchu, Taiwan
[4] Natl Chiao Tung Univ, Dept Photon, Hsinchu, Taiwan
[5] Natl Chiao Tung Univ, Inst Electoopt Engn, Hsinchu, Taiwan
来源
2016 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT) | 2016年
关键词
Bandgap Reference Circuit (BGR); Subthreshold Region; Native nMOS; REFERENCE CIRCUIT;
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Being operated with 0.3V supply voltage in a standard 65nm CMOS process, a new CMOS temperature compensated voltage reference circuit is proposed with subthreshold transistors and native nMOS. The reference drain current provided by the gate voltage of a subthreshold nMOS output transistor is nearly independent of temperature due to the existence of mutual compensation of mobility and threshold voltage variation. The new proposed temperature compensated voltage reference circuit functions well with the output voltage VREF of 168 mV at room temperature as no extra laser trimming is needed after fabrication. The total power consumption is about 70nW. With the VDD power supply of 0.3V, the temperature coefficient (TC) of voltage reference circuit is 105 ppm/degrees C as temperature varies from -20 degrees C to 100 degrees C. The chip size of the fabricated bandgap reference circuit is 0.0053mm(2).
引用
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页数:4
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