Mutation Rates across Budding Yeast Chromosome VI Are Correlated with Replication Timing

被引:118
作者
Lang, Gregory I. [1 ]
Murray, Andrew W. [1 ,2 ]
机构
[1] Harvard Univ, Dept Mol & Cellular Biol, Cambridge, MA 02138 USA
[2] Harvard Univ, FAS Ctr Syst Biol, Cambridge, MA 02138 USA
来源
GENOME BIOLOGY AND EVOLUTION | 2011年 / 3卷
基金
美国国家卫生研究院;
关键词
mutation rate; replication timing; DNA damage tolerance; budding yeast; DNA MISMATCH REPAIR; SACCHAROMYCES-CEREVISIAE; GENOME; SEQUENCE; GENES; FORK; EFFICIENCY; EVOLUTION; DELETION; NUMBER;
D O I
10.1093/gbe/evr054
中图分类号
Q [生物科学];
学科分类号
07 ; 0710 ; 09 ;
摘要
Previous experimental studies suggest that the mutation rate is nonuniform across the yeast genome. To characterize this variation across the genome more precisely, we measured the mutation rate of the URA3 gene integrated at 43 different locations tiled across Chromosome VI. We show that mutation rate varies 6-fold across a single chromosome, that this variation is correlated with replication timing, and we propose a model to explain this variation that relies on the temporal separation of two processes for replicating past damaged DNA: error-free DNA damage tolerance and translesion synthesis. This model is supported by the observation that eliminating translesion synthesis decreases this variation.
引用
收藏
页码:799 / 811
页数:13
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