Nonlinear Errors Resulting from Ghost Reflection and Its Coupling with Optical Mixing in Heterodyne Laser Interferometers

被引:28
作者
Fu, Haijin [1 ,2 ]
Wang, Yue [1 ]
Hu, Pengcheng [1 ]
Tan, Jiubin [1 ]
Fan, Zhigang [2 ]
机构
[1] Harbin Inst Technol, Inst Ultra Precis Optoelect Instrument Engn, Harbin 150001, Heilongjiang, Peoples R China
[2] Harbin Inst Technol, Postdoctoral Res Stn Opt Engn, Harbin 150001, Heilongjiang, Peoples R China
基金
中国国家自然科学基金;
关键词
laser sensor; heterodyne interferometer; optical nonlinearity; ghost reflection; optical mixing; PERIODIC NONLINEARITY; COMPENSATION;
D O I
10.3390/s18030758
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Even after the Heydemann correction, residual nonlinear errors, ranging from hundreds of picometers to several nanometers, are still found in heterodyne laser interferometers. This is a crucial factor impeding the realization of picometer level metrology, but its source and mechanism have barely been investigated. To study this problem, a novel nonlinear model based on optical mixing and coupling with ghost reflection is proposed and then verified by experiments. After intense investigation of this new model's influence, results indicate that new additional high-order and negative-order nonlinear harmonics, arising from ghost reflection and its coupling with optical mixing, have only a negligible contribution to the overall nonlinear error. In real applications, any effect on the Lissajous trajectory might be invisible due to the small ghost reflectance. However, even a tiny ghost reflection can significantly worsen the effectiveness of the Heydemann correction, or even make this correction completely ineffective, i.e., compensation makes the error larger rather than smaller. Moreover, the residual nonlinear error after correction is dominated only by ghost reflectance.
引用
收藏
页数:12
相关论文
共 21 条
[1]  
[Anonymous], 2013, International Technology Roadmap for Semiconductors (ITRS)-Emerging Research Devices
[2]   A frequency domain method for the measurement of nonlinearity in heterodyne interferometry [J].
Badami, VG ;
Patterson, SR .
PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 2000, 24 (01) :41-49
[3]   Modeling and verifying non-linearities in heterodyne displacement interferometry [J].
Cosijns, SJAG ;
Haitjema, H ;
Schellekens, PHJ .
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2002, 26 (04) :448-455
[4]   A simple method for the compensation of the nonlinearity in the heterodyne interferometer [J].
Eom, T ;
Choi, T ;
Lee, K ;
Choi, H ;
Lee, S .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2002, 13 (02) :222-225
[5]   A simple phase-encoding electronics for reducing the nonlinearity error of a heterodyne interferometer [J].
Eom, Tae Bong ;
Kim, Jong Ahn ;
Kang, Chu-Shik ;
Park, Byong Chon ;
Kim, Jae Wan .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2008, 19 (07)
[6]   DETERMINATION AND CORRECTION OF QUADRATURE FRINGE MEASUREMENT ERRORS IN INTERFEROMETERS [J].
HEYDEMANN, PLM .
APPLIED OPTICS, 1981, 20 (19) :3382-3384
[7]   INVESTIGATION AND COMPENSATION OF THE NONLINEARITY OF HETERODYNE INTERFEROMETERS [J].
HOU, WM ;
WILKENING, G .
PRECISION ENGINEERING-JOURNAL OF THE AMERICAN SOCIETY FOR PRECISION ENGINEERING, 1992, 14 (02) :91-98
[8]   Toward a nonlinearity model for a heterodyne interferometer: not based on double-frequency mixing [J].
Hu, Pengcheng ;
Bai, Yang ;
Zhao, Jinlong ;
Wu, Guolong ;
Tan, Jiubin .
OPTICS EXPRESS, 2015, 23 (20) :25935-25941
[9]   High resolution heterodyne interferometer without detectable periodic nonlinearity [J].
Joo, Ki-Nam ;
Ellis, Jonathan D. ;
Buice, Eric S. ;
Spronck, Jo W. ;
Schmidt, Robert H. Munnig .
OPTICS EXPRESS, 2010, 18 (02) :1159-1165
[10]   Simple heterodyne laser interferometer with subnanometer periodic errors [J].
Joo, Ki-Nam ;
Ellis, Jonathan D. ;
Spronck, Jo W. ;
van Kan, Paul J. M. ;
Schmidt, Robert H. Munnig .
OPTICS LETTERS, 2009, 34 (03) :386-388