Wavelength Characteristics of a Silicon Waveguide Mach-Zehnder Interferometer having a Ce:YIG cladding

被引：0

作者：

Nakatsuhara, Katsumi ^{[1
]}

Iijima, Natsuki ^{[1
]}

Hayama, Yoshiki ^{[1
]}

Katsumata, Naoya ^{[1
]}

Hijikata, Mao ^{[1
]}

Yamaguchi, Taka ^{[1
]}

Nishizawa, Takeshi ^{[1
]}

Takeda, Masayuki ^{[1
]}

Noge, Satoru ^{[2
]}

机构：

[1] Kanagawa Inst Technol, Dept Elect & Elect Engn, 1030 Simo Ogino, Atsugi, Kanagawa 2430292, Japan

[2] Numazu Coll, Natl Inst Technol, Dept Elect & Elect Engn, Numazu, Japan

来源：

2019 24TH MICROOPTICS CONFERENCE (MOC) | 2019年

关键词：

D O I：

10.23919/moc46630.2019.8982809

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Ce:YIG thin films deposited on the silicon substrates were fabricated and their crystalline quality was investigated. In addition, a silicon waveguide Mach-Zehnder interferometer having a crystallized Ce:YIG cladding was fabricated. The transmitted wavelength characteristic of the device was observed to be different depending on the magnetostatic field direction.

引用

页码：170 / 171

页数：2

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